BY Series SPM

 

 BY Series SPM

 

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  BY2000 Atomic Force Microscope AFM
  BY3000 Scanning Probe Microscope SPM


High Performance, Low Price  

 

 

High Performance

 

● Atomic-scale of resolution

 

● Large sample size

 

● With a DSP inside for great performance

 

● Realtime operating system embedded

 

● Fast Ethernet connection with computer 

 

 

Multi-function

● Atomic Force Microscope (AFM)

 

● Scanning Tunneling Microscope (STM)

 

● Lateral Force Microscope (LFM)

 

● Force Analysis: I-V Curve, I-Z Curve, Force Curve

 

● Online real-time 3D image for better observation

 

● Multi-channel signals for more sample details

 

● Trace-Retrace scan, Back-Forward scan

 

● Multi-Analysis: Granularity and Roughness

 

● Data load-out for further analysis

 

 

 

 

Easy Operation

 

● Fast automatically tip-engaging

 

● Simple change the tipholder to switch between STM and AFM

 

● Full digital control, auto system status recognition

 

● Software-based sample movement

 

● Nano-Movie function: Continuous data collection, storage and replay

 

● Modularized design for convenience of maintenance and future upgrade

 

 

  BY Series Brochure in English