BY Series SPM

 

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BY2000 Atomic Force Microscope AFM
BY3000 Scanning Probe Microscope SPM

High Performance, Low Price

 


High Performance

● Atomic-scale of resolution

● Large sample size

● With a DSP inside for great performance

● Realtime operating system embedded

● Fast Ethernet connection with computer

 


Multi-function

● Atomic Force Microscope (AFM)

● Scanning Tunneling Microscope (STM)

● Lateral Force Microscope (LFM)

● Force Analysis: I-V Curve, I-Z Curve, Force Curve

● Online real-time 3D image for better observation

● Multi-channel signals for more sample details

● Trace-Retrace scan, Back-Forward scan

● Multi-Analysis: Granularity and Roughness

● Data load-out for further analysis


 


Easy Operation

● Fast automatically tip-engaging

● Simple change the tipholder to switch between STM and AFM

● Full digital control, auto system status recognition

● Software-based sample movement

● Nano-Movie function: Continuous data collection, storage and replay

● Modularized design for convenience of maintenance and future upgrade
 

BY Series Brochure in English

 

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